Abramovici, Miron.

Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Rev. print. - New York : IEEE Press, [1994], c1990. - xviii, 652 p. : ill. ; 27 cm.

"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.

Includes bibliographical references and index.



0780310624 9780780310629

94233953


Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.

TK7874 / .A23 1990b

621.3815 / ABD 1990

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