Leakage in nanometer CMOS technologies / (Record no. 5989)

000 -LEADER
fixed length control field 03103cam a22004577a 4500
001 - CONTROL NUMBER
EWU control number 5989
003 - CONTROL NUMBER IDENTIFIER
control field BD-DhEWU
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20171217125549.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 050812s2006 nyua g b 001 0 eng d
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2005932184
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0387257373
International Standard Book Number 0387281339 (ebook)
International Standard Book Number 9780387257372
International Standard Book Number 9780387281339
035 ## - SYSTEM CONTROL NUMBER
OCLC control number (OCoLC)62510295
040 ## - CATALOGING SOURCE
Original cataloging agency RCE
Transcribing agency RCE
Modifying agency BAKER
-- UKM
-- OHX
-- DLC
-- BD-DhEWU
Language of cataloging eng
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871.99.M44
Item number L43 2006
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38412
Author mark and Year LEA 2006
245 00 - TITLE STATEMENT
Title Leakage in nanometer CMOS technologies /
Statement of responsibility, etc [ed. by] Siva G. Narendra, Anantha Chandrakasan.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc New York :
Name of publisher, distributor, etc Springer,
Date of publication, distribution, etc 2006.
300 ## - PHYSICAL DESCRIPTION
Extent x, 307 p. :
Other physical details ill. ;
Dimensions 24 cm.
440 #0 -
Title Series on integrated circuits and systems
-- 9893
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
505 ## - FORMATTED CONTENTS NOTE
Title Table of contents
Contents note Taxonomy of leakage : sources, impact, and solutions --<br/>Leakage dependence on input vector / Siva Narendra ... [et al.] --<br/>Power gating and dynamic voltage scaling / Benton Calhoun, James Kao, and Anantha Chandrakasan --<br/>Methodologies for power gating / Kimiyoshi Usami and Takayasu Sakurai --<br/>Body biasing / Tadahiro Kuroda and Takayasu Sakurai --<br/>Process variation and adaptive design / Siva Narendra ... [et al.] --<br/>Memory leakage reduction / Takayuki Kawahara and Kiyoo Itoh --<br/>Active leakage reduction and multi-performance devices / Siva Narendra ... [et al.] --<br/>Impact of leakage power and variation on testing / Ali Keshavarzi and Kaushik Roy --<br/>Case study : leakage reduction in Hitachi/Renesas microprocessors / Masayuki Miyazaki, Hiroyuki Mizuno, and Takayuki Kawahara --<br/>Case study : leakage reduction in the Intel Xscale microprocessor / Lawrence Clark --<br/>Transistor design to reduce leakage / Sagar Suthram, Siva Narendra, and Scott Thompson.
520 ## - SUMMARY, ETC.
Summary, etc Summary:<br/>Covers promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. This title highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.
526 ## - STUDY PROGRAM INFORMATION NOTE
Program name Electrical & Electronic Engineering
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name Metal oxide semiconductors, Complementary
General subdivision Design and construction.
9 (RLIN) 9894
Topical term or geographic name Integrated circuits
General subdivision Design and construction.
9 (RLIN) 9517
Topical term or geographic name Electric leakage
General subdivision Prevention.
9 (RLIN) 9895
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Narendra, Siva G.
Fuller form of name (Siva Gurusami),
Dates associated with a name 1971-
9 (RLIN) 9896
Personal name Chandrakasan, Anantha P.
9 (RLIN) 9897
856 41 - ELECTRONIC LOCATION AND ACCESS
Materials Specified Table of contents
Uniform Resource Identifier http://www.loc.gov/catdir/toc/fy0607/2005932184.html
Materials Specified Publisher description
Uniform Resource Identifier http://www.loc.gov/catdir/enhancements/fy0663/2005932184-d.html
Materials Specified WorldCat details
Uniform Resource Identifier http://www.worldcat.org/title/leakage-in-nanometer-cmos-technologies/oclc/62510295&referer=brief_results
Materials Specified E-Book Fulltext
Uniform Resource Identifier http://lib.ewubd.edu/ebook/5989
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type Text
Holdings
Lost status Source of classification or shelving scheme Not for loan Collection code Permanent Location Current Location Shelving location Date of accession Source of acquisition Cost, normal purchase price Full call number Barcode Copy number Koha item type Date last seen Price effective from
      Non-fiction EWU Library EWU Library Circulation Section 2009-07-23 Bangaldesh Photostat 448.00 621.38412 LEA 2006 22376 C-2 Text    
    Not For Loan Non-fiction EWU Library EWU Library Reserve Section 2009-01-07 Karim International 8200.00 621.38412 LEA 22116 C-1 Text    
      Non-fiction EWU Library EWU Library E-book 2017-12-17     621.38412 LEA 2006     E-Book 2017-12-17 2017-12-17

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