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Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

By: Abramovici, Miron.
Contributor(s): Breuer, Melvin A | Friedman, Arthur D.
Material type: TextTextPublisher: New York : IEEE Press, [1994], c1990Edition: Rev. print.Description: xviii, 652 p. : ill. ; 27 cm.ISBN: 0780310624; 9780780310629.Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and constructionDDC classification: 621.3815 Online resources: Contributor biographical information | Publisher description | Table of Contents | WorldCat details | E-Book Fulltext
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Item type Current location Collection Call number Copy number Status Date due Barcode Item holds
E-Book E-Book EWU Library
E-book
Non-fiction 621.3815 ABD 1990 (Browse shelf) Not for loan
Text Text EWU Library
Reserve Section
Non-fiction 621.3815 ABD (Browse shelf) C-1 Not For Loan 16349
Text Text EWU Library
Reserve Section
Non-fiction 621.3815 ABD (Browse shelf) C-2 Available 16350
Text Text EWU Library
Circulation Section
Non-fiction 621.3815 ABD (Browse shelf) C-3 Available 16517
Text Text EWU Library
Circulation Section
Non-fiction 621.3815 ABD (Browse shelf) C-4 Available 16518
Text Text EWU Library
Circulation Section
Non-fiction 621.3815 ABD (Browse shelf) C-5 Available 16519
Text Text EWU Library
Circulation Section
Non-fiction 621.3815 ABD (Browse shelf) C-6 Available 16520
Text Text EWU Library
Circulation Section
Non-fiction 621.3815 ABD (Browse shelf) C-7 Available 16521
Total holds: 0

"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.

Includes bibliographical references and index.

Electrical & Electronic Engineering

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