Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

By: Abramovici, Miron
Contributor(s): Breuer, Melvin A | Friedman, Arthur D
Material type: TextTextLanguage: English Publisher: New York : IEEE Press, [1994], c1990Edition: Rev. printDescription: xviii, 652 p. : ill. ; 27 cmISBN: 0780310624; 9780780310629Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and constructionDDC classification: 621.3815 LOC classification: TK7874 | .A23 1990bOnline resources: Contributor biographical information | Publisher description | Table of Contents | WorldCat details | E-Book Fulltext
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Non-fiction 621.3815 ABD 1990 (Browse shelf) Not for loan
Text Text EWU Library
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Non-fiction 621.3815 ABD (Browse shelf) C-1 Not For Loan 16349
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Non-fiction 621.3815 ABD (Browse shelf) C-3 Available 16517
Text Text EWU Library
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Text Text EWU Library
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Non-fiction 621.3815 ABD (Browse shelf) C-5 Available 16519
Text Text EWU Library
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Text Text EWU Library
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"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.

Includes bibliographical references and index.

Electrical & Electronic Engineering

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