Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
By: Abramovici, Miron
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Contributor(s): Breuer, Melvin A | Friedman, Arthur D.
Material type: 
TextPublisher: New York : IEEE Press, [1994], c1990Edition: Rev. print.Description: xviii, 652 p. : ill. ; 27 cm.ISBN: 0780310624; 9780780310629.Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and constructionDDC classification: 621.3815 Online resources: Contributor biographical information | Publisher description | Table of Contents | WorldCat details | E-Book Fulltext
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EWU Library E-book | Non-fiction | 621.3815 ABD 1990 (Browse shelf) | Not for loan | ||||
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EWU Library Circulation Section | Non-fiction | 621.3815 ABD (Browse shelf) | C-7 | Available | 16521 |
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| 621.3815 37 LED Digital circuits and logic design / | 621.3815 37 LED Digital circuits and logic design / | 621.3815 37 LED Digital circuits and logic design / | 621.3815 ABD Digital systems testing and testable design / | 621.3815 ABD Digital systems testing and testable design / | 621.3815 ABD Digital systems testing and testable design / | 621.3815 ABD Digital systems testing and testable design / |
"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.
Includes bibliographical references and index.
Electrical & Electronic Engineering
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