Fundamentals of semiconductor fabrication / Gary S. May, Simon M. Sze.
Material type:
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds | Course reserves |
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Dr. S. R. Lasker Library, EWU E-book | Non-fiction | 621.38152 MAF 2004 (Browse shelf(Opens below)) | Not for loan | |||||
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Dr. S. R. Lasker Library, EWU Reserve Section | Non-fiction | 621.38152 MAF 2004 (Browse shelf(Opens below)) | C-1 | Not For Loan | 20387 | |||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.38152 MAF 2004 (Browse shelf(Opens below)) | C-2 | Available | 20388 | |||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.38152 MAF 2004 (Browse shelf(Opens below)) | C-3 | Available | 20389 | |||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.38152 MAF 2004 (Browse shelf(Opens below)) | C-4 | Available | 20390 | |||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.38152 MAF 2004 (Browse shelf(Opens below)) | C-5 | Available | 20391 |
Includes bibliographical references and index.
TOC 1. Introduction --
2. Crystal growth --
3. Silicon oxidation --
4. Photolithography --
5. Etching --
6. Diffusion --
7. Ion implantation --
8. Film deposition --
9. Process integration --
10. IC manufacturing --
11. Future trends and challenges --
Appendixes: --
A. List of symbols --
B. International system of units (SI units) --
C. Unit prefixes --
D. Greek alphabet --
E. Physical constants --
F. Properties of Si and GaAs at 300K --
G. Some properties of the error function --
H. Basic kinetic theory of gases --
I. SUPREM commands --
J. Running PROLITH --
K. Percentage points of the t distribution --
L. Percentage points of the F distribution.
Summary:
From crystal growth to integrated devices and circuits, this new book offers a basic, up-to-date introduction to semiconductor fabrication technology, including both the theoretical and practical Read more...
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