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Leakage in nanometer CMOS technologies / [ed. by] Siva G. Narendra, Anantha Chandrakasan.

Contributor(s): Narendra, Siva G. (Siva Gurusami), 1971- | Chandrakasan, Anantha P.
Material type: TextTextSeries: Series on integrated circuits and systems. Publisher: New York : Springer, 2006Description: x, 307 p. : ill. ; 24 cm.ISBN: 0387257373; 0387281339 (ebook); 9780387257372; 9780387281339.Subject(s): Metal oxide semiconductors, Complementary -- Design and construction | Integrated circuits -- Design and construction | Electric leakage -- PreventionDDC classification: 621.38412 Online resources: Table of contents | Publisher description | WorldCat details | E-Book Fulltext
Contents:
Table of contents Taxonomy of leakage : sources, impact, and solutions -- Leakage dependence on input vector / Siva Narendra ... [et al.] -- Power gating and dynamic voltage scaling / Benton Calhoun, James Kao, and Anantha Chandrakasan -- Methodologies for power gating / Kimiyoshi Usami and Takayasu Sakurai -- Body biasing / Tadahiro Kuroda and Takayasu Sakurai -- Process variation and adaptive design / Siva Narendra ... [et al.] -- Memory leakage reduction / Takayuki Kawahara and Kiyoo Itoh -- Active leakage reduction and multi-performance devices / Siva Narendra ... [et al.] -- Impact of leakage power and variation on testing / Ali Keshavarzi and Kaushik Roy -- Case study : leakage reduction in Hitachi/Renesas microprocessors / Masayuki Miyazaki, Hiroyuki Mizuno, and Takayuki Kawahara -- Case study : leakage reduction in the Intel Xscale microprocessor / Lawrence Clark -- Transistor design to reduce leakage / Sagar Suthram, Siva Narendra, and Scott Thompson.
Summary: Summary: Covers promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. This title highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.
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Item type Current location Collection Call number Copy number Status Date due Barcode Item holds
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Non-fiction 621.38412 LEA 2006 (Browse shelf) Not for loan
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Non-fiction 621.38412 LEA (Browse shelf) C-1 Not For Loan 22116
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Non-fiction 621.38412 LEA 2006 (Browse shelf) C-2 Available 22376
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Includes bibliographical references and index.

Table of contents Taxonomy of leakage : sources, impact, and solutions --
Leakage dependence on input vector / Siva Narendra ... [et al.] --
Power gating and dynamic voltage scaling / Benton Calhoun, James Kao, and Anantha Chandrakasan --
Methodologies for power gating / Kimiyoshi Usami and Takayasu Sakurai --
Body biasing / Tadahiro Kuroda and Takayasu Sakurai --
Process variation and adaptive design / Siva Narendra ... [et al.] --
Memory leakage reduction / Takayuki Kawahara and Kiyoo Itoh --
Active leakage reduction and multi-performance devices / Siva Narendra ... [et al.] --
Impact of leakage power and variation on testing / Ali Keshavarzi and Kaushik Roy --
Case study : leakage reduction in Hitachi/Renesas microprocessors / Masayuki Miyazaki, Hiroyuki Mizuno, and Takayuki Kawahara --
Case study : leakage reduction in the Intel Xscale microprocessor / Lawrence Clark --
Transistor design to reduce leakage / Sagar Suthram, Siva Narendra, and Scott Thompson.

Summary:
Covers promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. This title highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.

Electrical & Electronic Engineering

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