TY - BOOK AU - Abramovici,Miron AU - Breuer,Melvin A. AU - Friedman,Arthur D. TI - Digital systems testing and testable design SN - 0780310624 AV - TK7874 .A23 1990b U1 - 621.3815 PY - 1994///], c1990 CY - New York PB - IEEE Press KW - Digital integrated circuits KW - Testing KW - Design and construction N1 - "This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso; Includes bibliographical references and index; EEE UR - http://www.loc.gov/catdir/bios/wiley045/94233953.html UR - http://www.loc.gov/catdir/description/wiley039/94233953.html UR - http://www.loc.gov/catdir/toc/onix07/94233953.html UR - http://www.worldcat.org/title/digital-systems-testing-and-testable-design/oclc/31415783&referer=brief_results UR - http://lib.ewubd.edu/ebook/4410 ER -