TY  - BOOK
AU  - Abramovici,Miron
AU  - Breuer,Melvin A.
AU  - Friedman,Arthur D.
TI  - Digital systems testing and testable design
SN  - 0780310624
AV  - TK7874 .A23 1990b
U1  - 621.3815 
PY  - 1994///], c1990
CY  - New York
PB  - IEEE Press
KW  - Digital integrated circuits
KW  - Testing
KW  - Design and construction
N1  - "This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso; Includes bibliographical references and index; EEE
UR  - http://www.loc.gov/catdir/bios/wiley045/94233953.html
UR  - http://www.loc.gov/catdir/description/wiley039/94233953.html
UR  - http://www.loc.gov/catdir/toc/onix07/94233953.html
UR  - http://www.worldcat.org/title/digital-systems-testing-and-testable-design/oclc/31415783&referer=brief_results
UR  - http://lib.ewubd.edu/ebook/4410
ER  -