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Device modeling for analog and RF CMOS circuit design / Trond Ytterdal, Yuhua Cheng, Tor A. Fjeldly.

By: Ytterdal, TrondContributor(s): Cheng, Yuhua, 1958- | Fjeldly, Tor AMaterial type: TextTextLanguage: English Publication details: Hoboken, NJ : Wiley, c2003. Description: xiii, 292 p. : ill. ; 26 cmISBN: 0471498696 (alk. paper); 9780471498698Subject(s): Metal oxide semiconductors, Complementary -- Computer-aided designDDC classification: 621.395 LOC classification: TK7871.99.M44 | Y78 2003Online resources: Table of contents | Publisher description | WorldCat details | E-Book Fulltext
Contents:
TOC 1. MOSFET Device Physics and Operation -- 2. MOSFET Fabrication -- 3. RF Modeling -- 4. Noise Modeling -- 5. Proper Modeling for Accurate Distortion Analysis -- 6. The BSIM4 MOSFET Model -- 7. The EKV Model -- 8. Other MOSFET Models -- 9. Bipolar Transistors in CMOS Technologies -- 10. Modeling of Passive Devices -- 11. Effects and Modeling of Process Variation and Device Mismatch -- 12. Quality Assurance of MOSFET Models.
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
E-Book E-Book Dr. S. R. Lasker Library, EWU
E-book 		Non-fiction 621.395 YTD 2003 (Browse shelf(Opens below)) Not for loan
Text Text Dr. S. R. Lasker Library, EWU
Reserve Section 		Non-fiction 621.395 YTD (Browse shelf(Opens below)) C-1 Not For Loan 22252
Text Text Dr. S. R. Lasker Library, EWU
Circulation Section 		Non-fiction 621.395 YTD 2003 (Browse shelf(Opens below)) C-2 Available 22343
Total holds: 0

Online version:
Ytterdal, Trond.
Device modeling for analog and RF CMOS circuit design.
Hoboken, NJ : Wiley, c2003
(OCoLC)606952946

Includes bibliographical references and index.

TOC 1. MOSFET Device Physics and Operation --
2. MOSFET Fabrication --
3. RF Modeling --
4. Noise Modeling --
5. Proper Modeling for Accurate Distortion Analysis --
6. The BSIM4 MOSFET Model --
7. The EKV Model --
8. Other MOSFET Models --
9. Bipolar Transistors in CMOS Technologies --
10. Modeling of Passive Devices --
11. Effects and Modeling of Process Variation and Device Mismatch --
12. Quality Assurance of MOSFET Models.

EEE

Tahur Ahmed

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