Transistor level modeling for analog/RF IC design / edited by Wladyslaw Grabinski, Bart Nauwelaers and Dominique Schreurs.
Material type: TextLanguage: English Publication details: Dordrecht : Springer, c2006. Description: xiii, 293 p. : ill. ; 25 cmISBN: 1402045557 (hd. bd.); 9781402045554 (hd. bd.); 9048171482 Subject(s): Metal oxide semiconductor field-effect transistors | Integrated circuits | Metal oxide semiconductorsDDC classification: 621.3815 LOC classification: TK7871.95 | .T73 2006Online resources: WorldCat details | E-Book FulltextItem type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
E-Book | Dr. S. R. Lasker Library, EWU E-book | Non-fiction | 621.3815 TRA 2006 (Browse shelf(Opens below)) | Not for loan | ||||
Text | Dr. S. R. Lasker Library, EWU Reserve Section | Non-fiction | 621.3815 TRA 2006 (Browse shelf(Opens below)) | C-1 | Not For Loan | 22004 |
Print version:
Transistor level modeling for analog/RF IC design.
Dordrecht : Springer, c2006
(OCoLC)68629648
Includes bibliographical references and index.
TOC Foreword; H.Iwai Introduction; W.Grabinski/ B.Nauwelaers/ D.Schreurs 1. 2/3D process and devices simulation; D.Donoval/ A.Vrbicky/ A.Chvala/P.Beno 2. PSP: An advanced surface-potential-based mosfet model; R.van Langevelde/ G.Gildenblat 3. EKV 3.0 mosfet model; M.Bucher/ A.Bazigos/ F.Drummenacher/ J-M.Sallese/ C.Enz 4. Modeling using high-frequency measurements; D.Schreurs 5. Empirical FET Models; I.Angelov 6. Modeling the SOI MOSFET Nonlinearities; B.Parvais/ A.Siligaris 7. Circuit level RF modeling and design; N.Itoh 8. On incorporating parasitic quantum effects in classical circuits simulations; F.Felgenhauer/ M.Begoin/ W.Mathis 9. Compact modeling of the MOSFET in VHDL-AMS; C.Lallement/ F.Pecheux/ A.Vachoux/ F.Pregaldiny 10. Compact modeling in Verilog-A; B.Troyanovsky/ P.O'Halloran/ M.Mierzwinski Index
Summary:
Presents practical knowledge in the field of MOS transistor modeling. This book covers the 2/3D process and device simulations with a focus on high-voltage MOSFET devices, the development of both PSP Read more...
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