Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
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TextLanguage: English Publication details: New York : IEEE Press, [1994], c1990. Edition: Rev. printDescription: xviii, 652 p. : ill. ; 27 cmISBN: 0780310624; 9780780310629Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and constructionDDC classification: 621.3815 LOC classification: TK7874 | .A23 1990bOnline resources: Contributor biographical information | Publisher description | Table of Contents | WorldCat details | E-Book Fulltext
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Dr. S. R. Lasker Library, EWU E-book | Non-fiction | 621.3815 ABD 1990 (Browse shelf(Opens below)) | Not for loan | ||||
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Dr. S. R. Lasker Library, EWU Reserve Section | Non-fiction | 621.3815 ABD (Browse shelf(Opens below)) | C-1 | Not For Loan | 16349 | ||
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Dr. S. R. Lasker Library, EWU Reserve Section | Non-fiction | 621.3815 ABD (Browse shelf(Opens below)) | C-2 | Available | 16350 | ||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.3815 ABD (Browse shelf(Opens below)) | C-3 | Available | 16517 | ||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.3815 ABD (Browse shelf(Opens below)) | C-4 | Available | 16518 | ||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.3815 ABD (Browse shelf(Opens below)) | C-5 | Available | 16519 | ||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.3815 ABD (Browse shelf(Opens below)) | C-6 | Available | 16520 | ||
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Dr. S. R. Lasker Library, EWU Circulation Section | Non-fiction | 621.3815 ABD (Browse shelf(Opens below)) | C-7 | Available | 16521 |
"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.
Includes bibliographical references and index.
EEE
Tahur Ahmed
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